In electron energy loss spectroscopy eels scanning confocal electron energy loss microscopy sceelm is a new analytical microscopy tool that enables a double corrected transmission electron microscope to achieve sub 10 nm depth resolution in depth sectioning imaging of nanomaterials. Within the last 30 years electron energy loss spectroscopy eels has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. Electron energy loss spectroscopy electron energy loss spectroscopy eels is a familiar technique used in transmission electron microscopes for measuring the ionization losses suffered by the pe beam disko et al 1992
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